R. Sathyavathi, et al., “Raman spectroscopic sensing of carbonate intercalation in breast microcalcifications at stereotactic biopsy,” Scientific Reports, vol. 5, pp. 9907 EP -, 2015. Publisher's Version
A. B. Alencar, A. P. M. Barboza, B. S. Archanjo, H. Chacham, and B. R. A. Neves, “Experimental and theoretical investigations of monolayer and few-layer talc,” 2d Materials, vol. 2, no. 1, 2015. Publisher's Version
C. K. Oliveira, et al., “Crystal-oriented wrinkles with origami-type junctions in few-layer hexagonal boron nitride,” Nano Research, vol. 8, no. 5, pp. 1680-1688, 2015. Publisher's Version
R. Nascimento, J. R. da Martins, R. J. C. Batista, and H. Chacham, “Band Gaps of BN-Doped Graphene: Fluctuations, Trends, and Bounds,” Journal of Physical Chemistry C, vol. 119, no. 9, pp. 5055-5061, 2015. Publisher's Version
S. M. Manhabosco, R. J. C. Batista, S. Neves da Silva, and L. F. P. Dick, “DETERMINATION OF CURRENT MAPS BY SVET OF HOT-DIP GALVANIZED STEEL UNDER SIMULTANEOUS STRAINING,” Electrochimica Acta, vol. 168, pp. 89-96, 2015. Publisher's Version
K. A. S. Araujo, et al., “Charge transfer between carbon nanotubes on surfaces,” Nanoscale, vol. 7, no. 39, pp. 16175-16181, 2015. Publisher's Version
A. L. de Lima, L. A. M. Muessnich, T. M. Manhabosco, H. Chacham, R. J. C. Batista, and A. B. Oliveira, “Soliton instability and fold formation in laterally compressed graphene,” Nanotechnology, vol. 26, no. 4, 2015. Publisher's Version
M. C. Prado, R. Nascimento, B. E. N. Faria, M. J. S. Matos, H. Chacham, and B. R. A. Neves, “Nanometre-scale identification of grain boundaries in MoS 2 through molecular decoration,” Nanotechnology, vol. 26, no. 47, pp. 475702, 2015. Publisher's VersionAbstract
In this paper, we address the challenge of identifying grain boundaries on the molybdenum disulphide (MoS 2 ) surface at the nanometre scale using a simple self-assembled monolayer (SAM) decoration method. Combined with atomic force microscopy, octadecylphosphonic acid monolayers readily reveal grain boundaries in MoS 2 at ambient conditions, without the need of atomic resolution measurements under vacuum. Additional ab initio calculations allow us to obtain the preferred orientation of the SAM structure relative to the MoS 2 beneath, and therefore, together with the experiments, the MoS 2 crystalline orientations at the grain boundaries. The proposed method enables the visualization of grain boundaries with sub-micrometer resolution for nanodevice investigation and failure analysis.